Memory test and repair technique for SoC based devices.

Mohammed Altaf Ahmed Abubaker E. M. Eljialy Sultan Ahmad

Published in: IEICE Electron. Express (2021)

Keyphrases

embedded systems
data sets
mobile devices
computing power
limited memory
data mining
social networks
data streams
test data
main memory
random access
past experience
storage devices
embedded devices
hardware software co design