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Invited: Pre-silicon Side Channel and Fault Analysis.

Jasper Van WoudenbergPeter GrossmannAvinash VarnaJoseph FrielDaniel DinuRonnie LindsaySteve J. Brown
Published in: DAC (2023)
Keyphrases
  • real time
  • neural network
  • video sequences
  • low cost
  • quantitative analysis
  • information retrieval
  • three dimensional
  • statistical analysis
  • fault diagnosis