Structural, Morphological, Topographical, and Electrical Properties of Selenized Stacked CIGSe Layers by Evaporation Technique.
G. RegmiJorge Sergio Narro-RiosA. AshokOnyekachi NwakanmaS. VelumaniF. A. Pulgarin-AgudeloPublished in: CCE (2018)
Keyphrases
- electrical properties
- image processing
- multiscale
- mathematical morphology
- structural analysis
- structural information
- multi layer
- artificial intelligence
- databases
- watershed segmentation
- structural features
- structuring elements
- silicon nitride
- film thickness
- morphological operations
- image sequences
- case study
- machine learning