An optimal probe testing algorithm for the connectivity verification of MCM substrates.
So-Zen YaoNan-Chi ChouChung-Kuan ChengT. C. HuPublished in: ICCAD (1992)
Keyphrases
- dynamic programming
- optimal solution
- detection algorithm
- high accuracy
- learning algorithm
- worst case
- times faster
- experimental evaluation
- objective function
- optimization algorithm
- probabilistic model
- cost function
- k means
- computational complexity
- search space
- theoretical analysis
- convergence rate
- model checking
- optimal parameters
- computationally efficient
- simulated annealing
- segmentation algorithm
- matching algorithm
- path planning
- state space
- computational cost
- improved algorithm
- exhaustive search
- globally optimal
- preprocessing
- locally optimal
- verification method