Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs.
Heejin KimHayeon ShinJiyoung ParkYoungtae ChoiJongwoo ParkPublished in: IRPS (2018)
Keyphrases
- statistical modeling
- predictive modeling
- statistical models
- prediction accuracy
- light emitting
- nonparametric bayesian
- steady state
- prediction error
- color images
- reliability analysis
- grayscale images
- prediction model
- color bands
- color image enhancement
- prediction algorithm
- neural network
- lightweight
- markov chain
- denoising
- multiscale
- feature selection