Defect-tolerant nanoelectronic pattern classifiers.
Jung Hoon LeeKonstantin K. LikharevPublished in: Int. J. Circuit Theory Appl. (2007)
Keyphrases
- training data
- pattern matching
- support vector
- decision trees
- test set
- feature selection
- pattern detection
- supervised classification
- classification algorithm
- classification systems
- classification rate
- classification models
- pattern discovery
- naive bayes
- training samples
- decision tree classifiers
- svm classifier
- data sets
- training examples
- machine learning algorithms
- training set
- individual classifiers
- decision boundary
- classifier systems
- supervised learning
- pattern recognition
- multiple classifier systems
- k nearest neighbour
- weak classifiers
- extracted features
- classification method
- class labels