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A paradigm for metric based inspection process for enhancing defect management.
T. R. Gopalakrishnan Nair
V. Suma
Published in:
ACM SIGSOFT Softw. Eng. Notes (2010)
Keyphrases
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defect detection
management system
distance measure
information systems
information management
neural network
metadata
database systems
data processing
decision support
life cycle
project management