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A paradigm for metric based inspection process for enhancing defect management.

T. R. Gopalakrishnan NairV. Suma
Published in: ACM SIGSOFT Softw. Eng. Notes (2010)
Keyphrases
  • defect detection
  • management system
  • distance measure
  • information systems
  • information management
  • neural network
  • metadata
  • database systems
  • data processing
  • decision support
  • life cycle
  • project management