Diagnostic errors and repetitive sequential classifications in on-line process control by attributes.
Roberto da Costa QuininoEmerson C. ColinLinda Lee HoPublished in: Eur. J. Oper. Res. (2010)
Keyphrases
- process control
- control system
- intelligent control
- manufacturing process
- semiconductor manufacturing
- product quality
- multi attribute
- decision making
- medical diagnosis
- continuous attributes
- error analysis
- prediction error
- attribute values
- expert systems
- sequential data
- repetitive patterns
- sequential search
- diagnostic reasoning
- concept lattice
- bayesian networks