Alleviating NBTI-induced failure in off-chip output drivers.

Bhavitavya Bhadviya Ayan Mandal Sunil P. Khatri

Published in: ACM Great Lakes Symposium on VLSI (2012)

Keyphrases

high speed
low cost
failure prediction
programmable logic
input variables
single chip
key factors
analog vlsi
failure detection
vlsi design
root cause
circuit design
database
operating system
input data
control system
evolutionary algorithm
databases