Login / Signup

Automatic linearity and frequency response tests with built-in pattern generator and analyzer.

Foster F. DaiCharles E. StroudDayu Yang
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2006)
Keyphrases
  • frequency response
  • pattern generator
  • frequency domain
  • impulse response
  • image segmentation
  • computational complexity
  • signal to noise ratio