An Application of IDD Spectrum Testing Method to the Fault Analysis.
Kazuhiro SakaguchiPublished in: ATS (2006)
Keyphrases
- data analysis
- detection method
- high precision
- synthetic data
- clustering method
- high accuracy
- fully automatic
- segmentation method
- error rate
- cost function
- preprocessing
- computational cost
- dynamic programming
- input data
- evolutionary algorithm
- pairwise
- computational complexity
- test data
- feature extraction
- image processing