Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations.
Jiyoung YoonBumgi LeeJaehee SongBokyoung KangSangho LeeDoh-Soon KwakHeonsang LimIlsang ParkJonghoon KimSangwoo PaePublished in: IRPS (2023)
Keyphrases
- high quality
- medical diagnosis
- quality assessment
- neural network
- high risk
- risk assessment
- integrated circuit
- quality measures
- risk management
- closely related
- fault diagnosis
- medical images
- model checking
- higher level
- image quality
- higher quality
- levels of abstraction
- knowledge level
- data sets
- clinically relevant
- safety analysis