Insect classification using Scanning Electron Microphotographs considering magnifications.
Akihiro TakahashiTakahiro OgawaMiki HaseyamaPublished in: ICIP (2013)
Keyphrases
- machine learning
- pattern classification
- classification accuracy
- pattern recognition
- classification process
- classification method
- feature vectors
- feature extraction
- image classification
- classification models
- support vector
- classification scheme
- support vector machine
- model selection
- unsupervised learning
- automatic classification
- support vector machine svm
- class labels
- classification algorithm
- training samples
- computer vision
- machine learning methods
- decision rules
- svm classifier
- supervised learning
- classification systems
- preprocessing
- data mining
- document classification
- cost sensitive
- image processing
- knn
- training set
- feature space