Highly Testable and Compact 1-out-of-n CMOS Checkers.

Cecilia Metra Michele Favalli Bruno Riccò

Published in: DFT (1994)

Keyphrases

power consumption
high speed
low cost
artificial intelligence
expert systems
vlsi circuits
learning algorithm
knowledge base
case study
image sequences
similarity measure
artificial neural networks
asynchronous circuits
delay insensitive