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Highly Testable and Compact 1-out-of-n CMOS Checkers.
Cecilia Metra
Michele Favalli
Bruno Riccò
Published in:
DFT (1994)
Keyphrases
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power consumption
high speed
low cost
artificial intelligence
expert systems
vlsi circuits
learning algorithm
knowledge base
case study
image sequences
similarity measure
artificial neural networks
asynchronous circuits
delay insensitive