A submicrometer MOS transistor I-V model for circuit simulation.
Hiroo MasudaJun'ichi ManoRyuichi IkematsuHitoshi SugiharaYukio AokiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
- mathematical model
- simulation model
- computational model
- probabilistic model
- formal model
- high speed
- high level
- model based diagnosis
- theoretical analysis
- simulation study
- discrete event
- learning algorithm
- mathematical analysis
- neural network model
- experimental data
- statistical model
- management system
- prior knowledge
- objective function
- knowledge base