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On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies.
Pelopidas Tsoumanis
Georgios Ioannis Paliaroutis
Nestoras E. Evmorfopoulos
George I. Stamoulis
Published in:
DFT (2021)
Keyphrases
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error rate
estimation error
test set
lower error rates
rule sets
electron beam
misclassification rate
human visual system
vlsi circuits
multi class
transmission line
text entry
cost sensitive classification
equal error rate