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Unified Model for Sub-Bandgap and Conventional Impact Ionization in RF SOI MOSFETs with Improved Simulator Convergence.
Chandan Yadav
Anupam Dutta
Saurabh Sirohi
Ethirajan Tamilmani
Yogesh Singh Chauhan
Published in:
VLSI Design (2016)
Keyphrases
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unified model
factors that influence
neural network
simulation model
convergence speed
computer vision
relevance feedback
image quality
database
data sets
search engine
test bed
improved algorithm
simulation environment
iterative algorithms
radio frequency