Defect Detection from Multi-frequency Limited Data via Topological Sensitivity.
José Félix FunesJosé Manuel PeralesMaría-Luisa RapúnJosé M. VegaPublished in: J. Math. Imaging Vis. (2016)
Keyphrases
- data sets
- defect detection
- data analysis
- data collection
- high quality
- database
- historical data
- application domains
- training data
- complex data
- original data
- raw data
- experimental data
- statistical analysis
- input data
- image data
- data points
- data sources
- data mining
- frequency domain
- missing data
- data mining algorithms
- data distribution
- knowledge discovery
- data objects
- data quality
- data structure