Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach.
Ludovic BoyerOlivier FruchierPetru Notingher Jr.Serge AgnelAlain ToureilleBernard RoussetJean-Louis SanchezPublished in: IAS (2008)
Keyphrases
- synthetic data
- data sets
- correlation analysis
- prior knowledge
- test data
- data analysis
- detection method
- data collection
- noisy data
- statistical analysis
- input data
- high accuracy
- data acquisition
- segmentation method
- missing data
- probabilistic model
- information loss
- statistical methods
- database
- original signal
- training data
- pairwise
- significant improvement
- support vector machine
- data points
- artificial neural networks
- data structure
- em algorithm
- objective function
- cost function
- network structure
- original data
- prior information
- knowledge discovery
- historical data
- graph representation
- neural network
- probability distribution