Near-threshold circuit variability in 14nm FinFETs for ultra-low power applications.
Sriram BalasubramanianNinad PimparkarMangesh KushareVinayak MahajanJuhi BansalTakashi ShimizuVivek JoshiKun QianArunima DasguptaKarthik ChandrasekaranChad WeintraubAli IcelPublished in: ISQED (2016)
Keyphrases
- ultra low power
- low power
- cmos technology
- high speed
- power consumption
- logic circuits
- power reduction
- low cost
- low voltage
- silicon on insulator
- threshold selection
- adaptive threshold
- metal oxide semiconductor
- data sets
- analog circuits
- database
- intra personal
- nm technology
- roc curve
- circuit design
- image processing
- delay insensitive