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Adaptive Threshold Processing of Secondary Electron Images in Scanning Electron Microscope.
Weiguo Bian
Mingyu Wang
Zhan Yang
Published in:
ICIRA (1) (2019)
Keyphrases
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image database
image data
scanning electron microscope
ground truth
image analysis
adaptive threshold
image retrieval
input image
three dimensional
gaussian noise
edge detection
video surveillance
pixel wise