Maximizing MLC NAND lifetime and reliability in the presence of write noise.

Borja Peleato Rajiv Agarwal

Published in: ICC (2012)

Keyphrases

signal to noise ratio
noise level
noisy data
additive noise
flash memory
read write
low cost
missing data
random noise
image noise
noise sensitivity
real time
reliability analysis
highly reliable
energy consumption
class labels
image quality
genetic algorithm
databases