Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates.

André Ivanov Fabrizio Lombardi Cecilia Metra

Published in: IEEE Des. Test Comput. (2004)

Keyphrases

recent advances
artificial intelligence
vlsi design
high speed
real time
current challenges
special issue
test set
signal processing
vlsi circuits
database
vlsi implementation
probabilistic model
multi agent
case study
decision trees
website
image processing
information systems
machine learning
data sets