Wafer map defect patterns classification based on a lightweight network and data augmentation.
Naigong YuHuaisheng ChenQiao XuMohammad Mehedi HasanSié OuattaraPublished in: CAAI Trans. Intell. Technol. (2023)
Keyphrases
- lightweight
- data sets
- training data
- classification accuracy
- data transfer
- data sources
- data collection
- machine learning
- interesting patterns
- sensor networks
- training samples
- rfid tags
- data mining techniques
- support vector machine
- knowledge discovery
- microarray
- network structure
- wireless sensor networks
- data analysis
- network resources
- input patterns
- communication infrastructure