Noise tolerant probabilistic logic for statistical pattern recognition applications.

Vicent Canals Christiam F. Frasser Miquel L. Alomar Antoni Morro Antoni Oliver Miquel Roca Eugeni Isern Víctor Martínez-Moll Eugeni García-Moreno Josep L. Rosselló

Published in: Integr. Comput. Aided Eng. (2017)

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