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Coping with Complexity of Testing Models for Real-Time Embedded Systems.

Ralf MitschingCarsten WeiseDominik FrankeThomas GerlitzStefan Kowalewski
Published in: SSIRI (Companion) (2011)
Keyphrases
  • real time embedded systems
  • probabilistic model
  • prior knowledge
  • neural network
  • database
  • data sets
  • learning algorithm
  • database systems
  • model selection
  • test data
  • bayesian framework
  • explanatory power