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Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling.
Peter E. Raad
Pavel L. Komarov
Mihai G. Burzo
Published in:
Microelectron. J. (2008)
Keyphrases
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feature vectors
image features
infrared
classification method
machine learning
low level
false positives
extracted features
feature extraction
training data
classification accuracy
image enhancement
embedded systems
invariant features
modeling method