BEW-YOLO: An Improved Method for PCB Defect Detection Based on YOLOv7.
Zhiyao LiAimin LiYuechen ZhangXiaotong KongWenqiang LiPublished in: ICPADS (2023)
Keyphrases
- defect detection
- experimental evaluation
- preprocessing
- fully automatic
- detection method
- high accuracy
- classification accuracy
- computational cost
- main contribution
- high precision
- dynamic programming
- similarity measure
- computational complexity
- computationally efficient
- theoretical analysis
- detection algorithm
- clustering method
- cost function
- significant improvement