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EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in.
Kunyang Liu
Hongliang Pu
Hirofumi Shinohara
Published in:
CICC (2020)
Keyphrases
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bit error rate
power consumption
signal to noise ratio
computer simulation
low power
multipath
code division multiple access
channel coding
mc cdma
soft decision
fading channels
low cost
random access memory
channel estimation
wireless channels
high speed
analytical model
mathematical model
web services