Look Back to Look Forward: The Classification Research Study Group and SIG/CR.
Kathryn La BarrePublished in: ASIS SIG/CR Classification Research Workshop (2002)
Keyphrases
- classification accuracy
- feature vectors
- theoretical framework
- supervised classification
- machine learning
- pattern recognition
- support vector machine svm
- statistical analysis
- classification scheme
- classification models
- pattern classification
- classification method
- statistically significant
- decision rules
- class labels
- data sets
- feature space
- preprocessing
- support vector
- feature extraction
- decision trees
- neural network