Multi-Gigahertz Testing of Wafer-Level Packaged Devices.

A. M. Majid David C. Keezer Jayasanker Jayabalan Mihai Rotaru

Published in: ITC (2006)

Keyphrases

high end
mobile devices
higher level
massively parallel
levels of abstraction
integrated circuit
test set
evolutionary algorithm
low cost
databases
multi agent systems
fine grained
personal computer
smart phones
bayesian networks
e learning
information retrieval
real world