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Correlation between Contact Resistance Characteristics and Scanning Tunneling Microscopy Images for Ag-Pd Alloy with Some Example Additives.

Terutaka Tamai
Published in: IEICE Trans. Electron. (2005)
Keyphrases
  • microscopy images
  • electron microscopy
  • multi channel
  • microscopic images
  • image processing
  • x ray
  • phase contrast
  • multiresolution
  • optical flow
  • structured light
  • cell division
  • confocal images