An efficient on-chip deterministic test pattern generation scheme.

Aloke K. Das Parimal Pal Chaudhuri

Published in: Microprocessing and Microprogramming (1989)

Keyphrases

high speed
vlsi implementation
relaxation algorithm
low cost
classification scheme
high density
bi directional
detection scheme
genetic algorithm
information systems
image processing
signal processing
computationally efficient
high bandwidth
vlsi design