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An efficient on-chip deterministic test pattern generation scheme.
Aloke K. Das
Parimal Pal Chaudhuri
Published in:
Microprocessing and Microprogramming (1989)
Keyphrases
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high speed
vlsi implementation
relaxation algorithm
low cost
classification scheme
high density
bi directional
detection scheme
genetic algorithm
information systems
image processing
signal processing
computationally efficient
high bandwidth
vlsi design