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Temperature behavior of combination selection based mismatch calibration with 65 nm CMOS technology.

Joona MarkuJonne PoikonenAri Paasio
Published in: SoCC (2009)
Keyphrases
  • cmos technology
  • low power
  • power consumption
  • parallel processing
  • spl times
  • low voltage
  • power dissipation
  • high speed
  • mixed signal
  • low cost
  • image sensor
  • pattern recognition
  • image processing