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The ESD protection characteristic and low-frequency noise analysis of GaN Schottky barrier diode with fluorine-based plasma treatment.

Hsien-Chin ChiuJi-Fan ChiHsuan-Ling KaoChia-Yi ChuKuan-Liang ChoFeng-Tso Chien
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • low frequency
  • high frequency
  • schottky barrier
  • frequency domain
  • wavelet transform
  • computer vision
  • image data
  • random noise
  • face recognition
  • mathematical analysis
  • high frequency components