Multichannel integrated lock-in amplifier for low noise measurements.
Cezary KolacinskiDariusz ObrebskiPublished in: MIXDES (2017)
Keyphrases
- measurement noise
- high sensitivity
- high noise
- measurement errors
- low signal to noise ratio
- measurement error
- random noise
- single channel
- noise model
- multi channel
- missing data
- signal to noise ratio
- image noise
- neural network
- concurrency control
- noisy data
- low cost
- noise free
- measurement data
- noise removal
- noise reduction