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Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges.

Youcef DjenouriGautam SrivastavaJerry Chun-Wei Lin
Published in: IEEE Instrum. Meas. Mag. (2024)
Keyphrases
  • defect detection
  • artificial intelligence
  • expert systems
  • benchmark datasets
  • lessons learned
  • future trends
  • database
  • neural network
  • real world
  • search engine
  • feature extraction
  • information technology