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Feature-based registration for correlative light and electron microscopy images.

David NamJudith MantellLorna HodgsonDavid R. BullPaul VerkadeAlin Achim
Published in: ICIP (2014)
Keyphrases
  • microscopy images
  • feature based registration
  • electron microscopy
  • x ray
  • deformable models
  • multi channel
  • diffusion tensor images
  • confocal images
  • thin film
  • phase contrast
  • mutual information
  • object boundaries