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Dynamic Probe Calibration for Quantitative Measurements with Atomic Force Microscopy.

Sergey BelikovJohn AlexanderSergei Magonov
Published in: ACC (2018)
Keyphrases
  • quantitative measurements
  • atomic force microscopy
  • neural network
  • database systems
  • real world
  • computer vision
  • face recognition
  • autocalibration