Low resolution slit-scan pattern recognition applying one-dimensional multiparameter analysis.

J. W. Betz G. V. Sengbusch W. Härtel

Published in: Pattern Recognit. (1981)

Keyphrases

low resolution
high resolution
pattern recognition
super resolution
high quality
resolution enhancement
image analysis
image super resolution
image patches
face images
image registration
signal processing
high resolution images
pixel intensities
higher resolution