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An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production.

Takeshi MizushimaKazuki ShirahataTasuku FujibeHidenobu MatsumuraDaisuke WatanabeHiroyuki MineoShin Masuda
Published in: ATS (2016)
Keyphrases
  • high volume
  • printed circuit boards
  • physical characteristics
  • big data
  • real time
  • fiber optic
  • mobile devices
  • databases
  • database systems