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A Layout Driven Design for Testability Technique for MOS VLSI Circuits.

Sungho KimPrithviraj BanerjeeSrinivas Patil
Published in: ITC (1991)
Keyphrases
  • vlsi circuits
  • layout design
  • case study
  • design process
  • design methodology
  • computer vision
  • image sequences
  • dynamic systems
  • low power