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Testability Expertise and Test Planning from High-Level Specifications.

Michel Crastes de PauletMargot KaramGabriele Saucier
Published in: ITC (1989)
Keyphrases
  • high level specifications
  • planning problems
  • test data generation
  • expert systems
  • heuristic search
  • data sets
  • machine learning
  • decision support
  • data exchange
  • schema mappings