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An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs.
Kenji Shimazaki
Makoto Nagata
Mitsuya Fukazawa
Shingo Miyahara
Masaaki Hirata
Kazuhiro Satoh
Hiroyuki Tsujikawa
Published in:
IEICE Trans. Electron. (2006)
Keyphrases
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real world
dynamic environments
noisy data
signal to noise ratio
asynchronous circuits
denoising
nm technology
data sets
image noise
face verification
gaussian noise
noise level
noise reduction
model checking
missing data
input data
data structure
image sequences
clustering algorithm