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A New Effective Methodology for Semiconductor Power Devices HTRB Testing.

Calogero PaceJorge Hernandez-AmbatoLetizia FragomeniGiuseppe ConsentinoAlessandro D'IgnotiSalvatore GalianoAntonio Grimaldi
Published in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
  • machine learning
  • database systems
  • steady state
  • power consumption
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  • test cases
  • cost effective
  • embedded systems