Sign in

Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS.

Peng ChenJun YinFeifei ZhangPui-In MakRui Paulo MartinsRobert Bogdan Staszewski
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2022)
Keyphrases
  • vlsi circuits
  • real time
  • databases
  • real world
  • learning algorithm
  • information systems
  • case study
  • video sequences
  • data analysis
  • low cost
  • high speed