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Read Noise Analysis in Analog Conductive-Metal-Oxide/HfOx ReRAM Devices.

Davide G. F. LombardoMamidala Saketh RamTommaso StecconiWooseok ChoiAntonio La PortaDonato Francesco FalconeBert J. OffreinValeria Bragaglia
Published in: DRC (2024)
Keyphrases
  • missing data
  • database
  • high speed
  • real time
  • databases
  • data analysis
  • mobile devices
  • software engineering
  • noise level
  • metal oxide