Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model.
Narayanaswamy BalakrishnanElena CastillaNirian MartínLeandro PardoPublished in: IEEE Trans. Reliab. (2020)
Keyphrases
- test data
- experimental data
- data sets
- simulation data
- prior knowledge
- data processing
- raw data
- measured data
- training data
- learning models
- data analysis
- network structure
- probability distribution
- data collection
- prior information
- mathematical model
- data points
- parameter estimation
- data mining techniques
- probabilistic model
- statistical methods
- data sources
- high quality
- high level
- neural network
- data gathering
- database
- end users
- bayesian networks
- empirical data
- predictive model
- bayesian model