Validation and analysis of negative differential resistance of single-electron transistor with conductance model.
Xiaobao ChenZuocheng XingBingcai SuiPublished in: ICECS (2012)
Keyphrases
- mathematical model
- computational model
- objective function
- probabilistic model
- empirical data
- statistical model
- low cost
- prior knowledge
- video sequences
- multiscale
- similarity measure
- high level
- data analysis
- expert systems
- data sets
- em algorithm
- statistical analysis
- case study
- learning algorithm
- hierarchical structure
- conceptual model
- positive and negative
- formal model
- neural network