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Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing.
Christopher Henard
Mike Papadakis
Gilles Perrouin
Jacques Klein
Yves Le Traon
Published in:
ICST Workshops (2013)
Keyphrases
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evolutionary algorithm
software product line
real time
databases
artificial neural networks
test set
genetic algorithm
distance measure
test cases